T85.110A Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), initial encounter

Billable ICD-10-CM code, FY2026.

Built from T85.110 with 7th character A (initial encounter).

Applies from T85 Complications of other internal prosthetic devices, implants and grafts

Excludes2 (not included here)

• failure and rejection of transplanted organs and tissue (T86.-)

7th character note

• The appropriate 7th character is to be added to each code from category T85

7th character required

• A — initial encounter
• D — subsequent encounter
• S — sequela

Risk adjustment (HCC)

• CMS-HCC V22: HCC 176 — Complications of Specified Implanted Device or Graft
• ESRD V24: HCC 176

Code annotations containing back-references to T85.110A

Back-references to T85.1

• Type 2 Excludes: T81.59 Other complications of foreign body accidentally left in body following procedure ("obstruction or perforation due to prosthetic devices and implants intentionally left in body (T82.0-T82.5, T83.0-T83.4, T83.7, T84.0-T84.4, T85.0-T85.6)")

Back-references to T85

• Type 2 Excludes: T78 Adverse effects, not elsewhere classified ("complications of surgical and medical care NEC (T80-T88)")
• Type 2 Excludes: T79 Certain early complications of trauma, not elsewhere classified ("complications occurring during or following medical procedures (T80-T88)")
• Type 2 Excludes: T79 Certain early complications of trauma, not elsewhere classified ("complications of surgical and medical care NEC (T80-T88)")
• Type 2 Excludes: T81 Complications of procedures, not elsewhere classified ("complication of prosthetic devices, implants and grafts (T82-T85)")
• Type 2 Excludes: T88 Other complications of surgical and medical care, not elsewhere classified ("complications of devices, implants and grafts (T82-T85)")
• Type 2 Excludes: Z96 Presence of other functional implants ("complications of internal prosthetic devices, implants and grafts (T82-T85)")
• Type 1 Excludes: Z97 Presence of other devices ("complications of internal prosthetic devices, implants and grafts (T82-T85)")

Diagnosis Index entries for T85.110A

• Complication (s) (from) (of) › electronic stimulator device › brain › mechanical › breakdown

Nearby codes

• T85.09XD Other mechanical complication of ventricular intracranial (communicating) shunt, subsequent encounter
• T85.09XS Other mechanical complication of ventricular intracranial (communicating) shunt, sequela
• T85.1 Mechanical complication of implanted electronic stimulator of nervous system
• T85.11 Breakdown (mechanical) of implanted electronic stimulator of nervous system
• T85.110 Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead)
• T85.110A Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), initial encounter (this code)
• T85.110D Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), subsequent encounter
• T85.110S Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead), sequela
• T85.111 Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead)
• T85.111A Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead), initial encounter
• T85.111D Breakdown (mechanical) of implanted electronic neurostimulator of peripheral nerve electrode (lead), subsequent encounter